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Volumn 15, Issue 2, 2000, Pages 139-141
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X-ray powder diffraction data for δ-Na2Si2O5
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Author keywords
[No Author keywords available]
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Indexed keywords
DIFFRACTION;
RIETVELD ANALYSIS;
X RAY POWDER DIFFRACTION;
CRYSTALLOGRAPHIC DATA;
PRESSED POWDERS;
SPACE GROUPS;
WATER GLASS;
X-RAY POWDER;
X RAYS;
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EID: 0034337889
PISSN: 08857156
EISSN: 19457413
Source Type: Journal
DOI: 10.1017/s0885715600011003 Document Type: Article |
Times cited : (5)
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References (11)
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