Lattice metric singularities and their impact on the indexing of powder patterns

Powder Diffraction

Volumn 15, Issue 2, 2000, Pages 82-85

  Mighell, Alan D ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CELLS; CYTOLOGY; X RAY POWDER DIFFRACTION;

EXPERIMENTAL ERRORS; FIGURE OF MERITS; INDEXING PROGRAMS; INPUT PARAMETER; LATTICE METRIC SINGULARITY; MONOCLINIC LATTICES; POWDER PATTERNS; RHOMBOHEDRAL CELLS;

INDEXING (OF INFORMATION);

EID: 0034337812     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1017/S0885715600010873     Document Type: Article

References (12)

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10. N: A criterion for rating powder diffraction patterns and evaluating the reliability of powder-pattern indexing," J. Appl. Crystallogr. 12, 60-65.
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