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Volumn 49, Issue 5, 2000, Pages 929-932

Heteroorganic betaines 2. * X-ray diffraction study of betaines containing the +P-C-Si-S- fragment

Author keywords

Silicon containing organophosphorus betaines containing the thiolate center; X ray diffraction study

Indexed keywords


EID: 0034336254     PISSN: 10665285     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02494720     Document Type: Article
Times cited : (2)

References (16)
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    • (2000) Russ. Chem. Bull. , vol.49 , pp. 920
  • 4
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    • Engl. Transl.
    • N. N. Zemlyanskii, I. V. Borisova, A. K. Shestakova, and Yu. A. Ustynyuk, Izv. Akad. Nauk, Ser. Khim., 1993, 2140 [Russ. Chem. Bull., 1993, 42, 2056 (Engl. Transl.)].
    • (1993) Russ. Chem. Bull. , vol.42 , pp. 2056
  • 6
    • 0001947970 scopus 로고
    • Engl. Transl.
    • N. N. Zemlyanskii, I. V. Borisova, A. K. Shestakova, and Yu. A. Ustynyuk, Izv. Akad. Nauk, Ser. Khim., 1993, 2143 [Russ. Chem. Bull., 1993, 42, 2053 (Engl. Transl.)].
    • (1993) Russ. Chem. Bull. , vol.42 , pp. 2053
  • 9
    • 0001713869 scopus 로고
    • Engl. Transl.
    • N. N. Zemlyanskii, I. V. Borisova, Yu. A. Ustynyuk, S. V. Lindeman, Yu. T. Struchkov, and V. N. Khrustalev, Izv. Akad. Nauk, Ser. Khim., 1994, 339 [Russ. Chem. Bull., 1994, 43, 318 (Engl. Transl.)].
    • (1994) Russ. Chem. Bull. , vol.43 , pp. 318
  • 15
    • 0004150157 scopus 로고
    • Siemens Analytical X-Ray Instruments, Inc., Madison (WI)
    • G. M. Sheldrick, SHELXTL, PC Version 4.0, Siemens Analytical X-Ray Instruments, Inc., Madison (WI), 1989.
    • (1989) SHELXTL, PC Version 4.0
    • Sheldrick, G.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.