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Volumn 221, Issue 2, 2000, Pages 641-645

Electrical activity of nitrogen-oxygen complexes in silicon

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0034336003     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3951(200010)221:2<641::AID-PSSB641>3.0.CO;2-Z     Document Type: Article
Times cited : (4)

References (14)
  • 1
    • 0347714184 scopus 로고
    • Eds. S. MAHAJAN and J. W. CORBETT, North-Holland Publ. Co., Amsterdam
    • T. ABE, H. HARADA, and J. CHIKAWA, Defects in Semiconductors II, Eds. S. MAHAJAN and J. W. CORBETT, North-Holland Publ. Co., Amsterdam 1983 (p. 1).
    • (1983) Defects in Semiconductors , vol.2 , pp. 1
    • Abe, T.1    Harada, H.2    Chikawa, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.