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Volumn 72, Issue 21, 2000, Pages
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Think carefully, and take more data
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Author keywords
[No Author keywords available]
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Indexed keywords
ACCURACY;
ANALYTIC METHOD;
COMPUTER PROGRAM;
EDITORIAL;
INFORMATION PROCESSING;
MEASUREMENT;
OPTICS;
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EID: 0034331390
PISSN: 00032700
EISSN: None
Source Type: Journal
DOI: 10.1021/ac0029657 Document Type: Editorial |
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Times cited : (5)
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References (0)
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