Investigation of thermal expansion measurement of brass strip H62 after high current density electropulsing by the CCD technique

Materials Science and Engineering A

Volumn 292, Issue 2, 2000, Pages 183-188

  He, Guanhu ^a,b   Wang, Baoquan ^b   Guo, Xiaonan ^b   Yang, Fei ^b   Guo, Jingdong ^a,b   Zhou, Benlian ^a,b  

^a INTERNATIONAL CENTRE FOR MATERIALS PHYSICS   (China)

^b INSTITUTE OF METAL RESEARCH   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; CURRENT DENSITY; IN SITU PROCESSING; THERMAL EXPANSION; TRANSMISSION ELECTRON MICROSCOPY;

ELECTROPULSINGS;

BRASS;

EID: 0034325728     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(00)01009-1     Document Type: Article

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