A general model of 1/fγ noise

Microelectronics Reliability

Volumn 40, Issue 11, 2000, Pages 1775-1780

  Pellegrini, Bruno ^a  

^a UNIVERSITY OF PISA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

RELAXATION PROCESSES; SEMICONDUCTOR DEVICE MODELS; SPURIOUS SIGNAL NOISE;

CHARGE FLUCTUATIONS; COUPLING COEFFICIENTS;

MICROELECTRONICS;

EID: 0034325617     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0026-2714(00)00061-5     Document Type: Article

References (9)

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6. Mc Worter AL. Lincoln Laboratory Technical Report No. 80. MIT, 1955.
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