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Volumn 282, Issue 1, 2000, Pages 47-53
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Effect of partial damage efficiencies on the radiation-induced segregation in binary alloys
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Author keywords
[No Author keywords available]
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Indexed keywords
BINARY ALLOYS;
MATHEMATICAL MODELS;
MICROSCOPIC EXAMINATION;
POINT DEFECTS;
SEGREGATION (METALLOGRAPHY);
PARTIAL DAMAGE EFFICIENCIES;
RADIATION-INDUCED SEGREGATION (RIS);
RADIATION EFFECTS;
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EID: 0034325060
PISSN: 00223115
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-3115(00)00396-2 Document Type: Article |
Times cited : (4)
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References (11)
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