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Volumn 86, Issue 3, 2000, Pages 197-205

Limiting characteristics of diode temperature sensors

Author keywords

[No Author keywords available]

Indexed keywords

OPTIMIZATION; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DIODES; SEMICONDUCTOR JUNCTIONS; SENSITIVITY ANALYSIS; THERMOANALYSIS;

EID: 0034324221     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(00)00445-3     Document Type: Article
Times cited : (32)

References (14)
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    • (in Russian)
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    • (1972) Kriog. Vak. Tekh. , vol.2 , pp. 69-78
    • Logvinenko, S.P.1    Aluf, T.D.2    Zarochintseva, T.M.3
  • 3
    • 0019088660 scopus 로고
    • Effect of current on the low temperature characteristics of diode sensors
    • Chopra V., Dharmadurai G. Effect of current on the low temperature characteristics of diode sensors. Cryogenics. 20:1980;659-662.
    • (1980) Cryogenics , vol.20 , pp. 659-662
    • Chopra, V.1    Dharmadurai, G.2
  • 4
    • 0020781858 scopus 로고
    • Gallium arsenide phosphide light-emitting diodes as general thermometers above 35 K
    • Cheeke J.D.N., Neron C., Brunelle A. Gallium arsenide phosphide light-emitting diodes as general thermometers above 35 K. Rev. Sci. Instrum. 54:1983;900-902.
    • (1983) Rev. Sci. Instrum. , vol.54 , pp. 900-902
    • Cheeke, J.D.N.1    Neron, C.2    Brunelle, A.3
  • 5
    • 84944485155 scopus 로고
    • The theory of pn-junctions in semiconductors and pn-junction transistors
    • Shockley W. The theory of pn-junctions in semiconductors and pn-junction transistors. Bell Syst. Tech. J. 28:1949;435-489.
    • (1949) Bell Syst. Tech. J. , vol.28 , pp. 435-489
    • Shockley, W.1
  • 6
    • 0342373289 scopus 로고
    • Residual non-idealities in the almost ideal silicon p-n junction
    • Cerofolini J.F., Polignano M.L. Residual non-idealities in the almost ideal silicon p-n junction. Appl. Phys. A. 50:1990;273-286.
    • (1990) Appl. Phys. a , vol.50 , pp. 273-286
    • Cerofolini, J.F.1    Polignano, M.L.2
  • 9
    • 36449004978 scopus 로고
    • Extraction of the minority carrier recombination lifetime from forward diode characteristics
    • Vanhellemont J., Simoen E., Claeys C. Extraction of the minority carrier recombination lifetime from forward diode characteristics. Appl. Phys. Lett. 66:1995;2894-2896.
    • (1995) Appl. Phys. Lett. , vol.66 , pp. 2894-2896
    • Vanhellemont, J.1    Simoen, E.2    Claeys, C.3
  • 10
    • 21544482159 scopus 로고
    • Picosecond photoconductivity in germanium film
    • De Fonzo A.P. Picosecond photoconductivity in germanium film. Appl. Phys. Lett. 39:1981;480-482.
    • (1981) Appl. Phys. Lett. , vol.39 , pp. 480-482
    • De Fonzo, A.P.1
  • 11
    • 0021475439 scopus 로고
    • Observed circuit limits to time resolution in correlation measurements
    • Hammond R.B., Paulter N.G., Wagner R.S. Observed circuit limits to time resolution in correlation measurements. Appl. Phys. Lett. 45:1984;289-291.
    • (1984) Appl. Phys. Lett. , vol.45 , pp. 289-291
    • Hammond, R.B.1    Paulter, N.G.2    Wagner, R.S.3
  • 12
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    • Lasergesteuertes sghnelles optoelektronisches Schalten in Halbleitern
    • Bruckner V., Kerstan F. Lasergesteuertes sghnelles optoelektronisches Schalten in Halbleitern. Exp. Tech. Phys. 32:1984;139-154.
    • (1984) Exp. Tech. Phys. , vol.32 , pp. 139-154
    • Bruckner, V.1    Kerstan, F.2
  • 14
    • 0010752779 scopus 로고
    • USA: Lake Shore Cryotronics. part 1 of 2
    • Temperature Measurement and Control. 1995;Lake Shore Cryotronics, USA. part 1 of 2.
    • (1995) Temperature Measurement and Control


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.