Temperature dependency of x-cut LiNbO3 modulator DC drift

Electronics Letters

Volumn 36, Issue 23, 2000, Pages 1952-1953

  Nagata, H ^a   Ishizuka, Y ^a   Akizuki, K ^a  

^a SUMITOMO OSAKA CEMENT CO LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; INTEGRATED OPTICS; LITHIUM NIOBATE; STATISTICAL METHODS;

END OF LIFE (EOL) CRITERION;

LIGHT MODULATORS;

EID: 0034323347     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20001355     Document Type: Article

References (4)

1. 3 optical intensity modulators', IEEE Photonics Technol. Lett., 2000, 12, (4), pp. 386-388
2. POWELL, M.A., and DONNELL, A.O.: 'What integrated optics is really used for', Opt. Photonics News, 1997, 8, (9), pp. 23-28
3. MAACK, D.R.: 'Reliability of lithium niobate Mach Zehnder modulators for digital optical fiber telecommunication systems', SPIE Crit. Rev., 1999, CR73, pp. 197-230
4. TOBIAS, P.A., and TRINDADE, D.C.: 'Applied reliability' (Van Nostrand Reinhold, New York, 1995), 2nd edn.