Penetration depth of energetic F atoms from F2 dissociation in layered rare gas samples

Journal of Chemical Physics

Volumn 113, Issue 18, 2000, Pages 8260-8265

  Dickgiesser M ^a   Schwentner, N ^a  

^a FREIE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; COMPUTER SIMULATION; CRYSTAL GROWTH; DEPOSITION; INERT GASES; INTERDIFFUSION (SOLIDS); KINETIC ENERGY; MONOLAYERS; MULTILAYERS; PHOTODISSOCIATION; SUBSTRATES;

UNINTENTIONAL MULTISTEP EXCITATION;

FLUORINE;

EID: 0034323010     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1317227     Document Type: Article

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