Spectroscopic characterization of the bonding, orientation, and coverage of copper tetraazaphthalocyanine monolayer films on SiO2 surfaces

Journal of Physical Chemistry B

Volumn 104, Issue 45, 2000, Pages 10627-10634

  Öberg, Kjell ^a   Edlund, Ulf ^a   Eliasson, Bertil ^a   Shchukarev, Andrei ^a,b   Seshadri, Kannan ^b   Allara, David ^a,b  

^a UMEÅ UNIVERSITY   (Sweden)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ATOMIC FORCE MICROSCOPY; BONDING; COMPOSITION; CRYSTAL ORIENTATION; ELLIPSOMETRY; LANGMUIR BLODGETT FILMS; MONOLAYERS; SEMICONDUCTING FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

MONOLAYER FILMS;

SILICON COMPOUNDS;

EID: 0034322773     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp002634y     Document Type: Article

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