Universal scaling of the M- and N-shell ionization probabilities measured in collisions of O, Si and S ions with heavy atoms

Journal of Physics B: Atomic, Molecular and Optical Physics

Volumn 33, Issue 21, 2000, Pages

  Banas D ^a   Braziewicz, J ^a   Majewska, U ^a   Pajek, M ^a   Semaniak, J ^a   Czyzewski, T ^b   Jaskola M ^b   Kretschmer, W ^c   Mukoyama, T ^d   Trautmann, D ^e  

^a JAN KOCHANOWSKI UNIVERSITY   (Poland)

^b SOLTAN INSTITUTE FOR NUCLEAR STUDIES   (Poland)

^c UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^d KANSAI GAIDAI UNIVERSITY   (Japan)

^e UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; ELECTRON ENERGY LEVELS; ELECTRON TRANSITIONS; MATHEMATICAL MODELS; OXYGEN; PROBABILITY; SEMICONDUCTOR MATERIALS; SILICON; SULFUR; X RAY SPECTROSCOPY;

GEOMETRICAL MODELS; HEAVY ATOMS; IONIC COLLISIONS; IONIZATION PROBABILITIES;

IONIZATION OF SOLIDS;

EID: 0034322187     PISSN: 09534075     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-4075/33/21/101     Document Type: Article

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