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Volumn 147, Issue 11, 2000, Pages 4318-4323
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Investigation of aluminum-indium alloys for interconnect applications
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
DIFFUSION IN SOLIDS;
ELECTRIC CONDUCTIVITY OF SOLIDS;
ELECTROMIGRATION;
ELECTRONIC STRUCTURE;
INDIUM;
MICROSTRUCTURE;
SOLID SOLUTIONS;
TERNARY SYSTEMS;
ALUMINUM-INDIUM ALLOYS;
INTERCONNECTS;
ALUMINUM ALLOYS;
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EID: 0034322134
PISSN: 00134651
EISSN: None
Source Type: Journal
DOI: 10.1149/1.1394062 Document Type: Article |
Times cited : (3)
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References (15)
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