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Sensors and Actuators, B: Chemical

Volumn 71, Issue 1-2, 2000, Pages 123-126

Composition and structure of tin/vanadium oxide surfaces for chemical sensing applications

(9) Lavacchi, A a Cortigiani, B a Rovida, G a Bardi, U a Atrei, A b Angelucci, R c Dori, L c Nicoletti, S c Poggi, A c

a UNIVERSITY OF FLORENCE (Italy)

b UNIVERSITY OF SIENA (Italy)

c CNR (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; DEPOSITION; EPITAXIAL GROWTH; HEAT TREATMENT; MICROSENSORS; THIN FILMS; TIN COMPOUNDS; VANADIUM COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

LOW ENERGY ION SCATTERING (LEIS); X RAY PHOTOELECTRON DIFFRACTION (XPD) ANALYSIS;

CHEMICAL SENSORS;

EID: 0034321696 PISSN: 09254005 EISSN: None Source Type: Journal
DOI: 10.1016/S0925-4005(00)00596-7 Document Type: Article

Times cited : (35)

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