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Volumn 15, Issue 11, 2000, Pages 1065-1070

Analytical model for current-voltage characteristics of a small-geometry poly-Si thin-film transistor

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; GRAIN BOUNDARIES; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MODELS; THRESHOLD VOLTAGE;

EID: 0034321619     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/15/11/310     Document Type: Article
Times cited : (8)

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  • 2
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    • Hawkins W G 1986 Polycrystalline-silicon device technology for large area electronics IEEE Trans. Electron Devices 33 477
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    • Hawkins, W.G.1
  • 5
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    • A physical based analytical turn-on model of polysilicon thin-film transistors for circuit simulation
    • Yang G-Y, Hur S-H and Han C-H 1999 A physical based analytical turn-on model of polysilicon thin-film transistors for circuit simulation IEEE Trans. Electron Devices 46 165
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    • Yang, G.-Y.1    Hur, S.-H.2    Han, C.-H.3
  • 6
    • 0029346006 scopus 로고
    • An analytical model tor the above-threshold characteristics of polysilicon thin-film transistors
    • Chern H N, Lee C L and Lei T F 1995 An analytical model tor the above-threshold characteristics of polysilicon thin-film transistors IEEE Trans. Electron Devices 42 1240
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  • 7
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    • A Quasi-two-dimensional analytical model for the turn-on characteristics of polysilicon thin-film transistors
    • Lin P S, Guo J Y and Wu C Y 1990 A Quasi-two-dimensional analytical model for the turn-on characteristics of polysilicon thin-film transistors IEEE Trans. Electron Devices 37 666
    • (1990) IEEE Trans. Electron Devices , vol.37 , pp. 666
    • Lin, P.S.1    Guo, J.Y.2    Wu, C.Y.3
  • 8
    • 0025955121 scopus 로고
    • Polysilicon thin-film transistors with channel length and width comparable to or smaller than the grain size of the thin film
    • Yamauchi N, Hajjar J J and Raif R 1991 Polysilicon thin-film transistors with channel length and width comparable to or smaller than the grain size of the thin film IEEE Trans. Electron Devices 38 55
    • (1991) IEEE Trans. Electron Devices , vol.38 , pp. 55
    • Yamauchi, N.1    Hajjar, J.J.2    Raif, R.3
  • 9
    • 0033880336 scopus 로고    scopus 로고
    • Subthreshold conduction in short-channel polycrystalline-silicon thin-film transistors
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  • 10
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.