Optical anisotropy of quartz in the presence of temperature-dependent multiple reflections using a high-accuracy universal polarimeter

Journal of Physics D: Applied Physics

Volumn 33, Issue 22, 2000, Pages 2985-2994

  Hernandez Rodriguez C ^a   Gomez Garrido P ^a  

^a UNIVERSIDAD DE LA LAGUNA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; BIREFRINGENCE; LEAST SQUARES APPROXIMATIONS; LIGHT REFLECTION; MOLECULAR ORIENTATION; POLARIMETERS; THERMAL EFFECTS;

HIGH-ACCURACY UNIVERSAL POLARIMETER (HAUP); LEVENBERG-MARQUARDT METHOD;

QUARTZ;

EID: 0034321221     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/33/22/318     Document Type: Article

References (36)

1. Kobayashi J and Uesu Y 1983 J. Appl. Cryst. 16 204
2. Kobayashi J, Uesu Y and Takehara H 1983 J. Appl. Cryst. 16 212
3. Meekes H and Janner A 1988 Phys. Rev. B 38 8075
4. Moxon J R L and Renshaw A R 1990 J. Phys.: Condens. Matter 2 6807
5. Holmes D A 1964 J. Opt. Soc. Am. 54 1115
6. Melle H 1986 Optik 72 157
7. Landry G D and Maldonado T A 1996 Appl. Opt. 35 5870
8. Zander K, Moser J and Melle H 1985 Optik (Stuttgart) 70 6
9. Oakberg T C 1995 Opt. Eng. 34 1545
10. Wen T D, Raptis Y S, Anastassakis E, Lalov I J and Miteva A I 1995 J. Phys. D: Appl. Phys. 28 2128
11. Miteva A I, Lalov I J, Wen T, Raptis Y S and Anastassakis E 1996 J. Phys. D: Appl. Phys. 29 2705
12. Pietraszkiewicz K, Wozniak W A and Kurzynowski P 1995 J. Opt. Am. A 12 420
13. Landry G D and Maldonado T A 1996 J. Soc. Am. A 13 1737
14. Heinemann S 1991 J. Mod. Opt. 38 1721
15. Simon J, Weber J and Unruh H-G 1997 J. Phys. D: Appl. Phys. 30 676
16. Gómez P and Hernández C 1998 J. Opt. Soc. Am. B 15 1147
17. Folcia C L, Ortega J and Etxebarria J 1999 J. Phys. D: Appl. Phys. 32 2266
18. Azzam R M A and Bashara N M 1989 Ellipsometry and Polarized Light (Amsterdam: North-Holland) ch 1, p 27
19. Azzam R M A and Bashara N M 1989 Ellipsometry and Polarized Light (Amsterdam: North-Holland) ch 1, p 64
20. Rogers A J 1977 Proc. R. Soc. A 353 177
21. Nye J F 1985 Physical Properties of Crystals (Oxford: Oxford University Press) ch 14
22. Kobayashi J, Kumoni J and Saito K 1986 J. Appl. Cryst. 19 337
23. Hernández-Rodríguez C, Gómez-Garrido P and Veitemillas S 2000 J. Appl. Cryst. 33 938
24. Kremers M and Meekes H 1995 J. Phys. D: Appl. Phys. 28 1195
25. Press W H, Flannery B P, Teukolsky S A and Vetterling W T 1986 Numerical Recipes. The Art of Scientific Computing (New York: Cambridge University Press) p 523
26. Bachheimer J P and Dolino G 1974 Phys. Rev. B 11 3195
27. Modine F A, Major R W and Sonder E 1975 Appl. Opt. 14 757
28. Micheli F J 1972 American Institute of Physics Handbook (New York: McGraw-Hill) p 6
29. Cady W G 1946 Piezoelectricity: An Introduction to the Theory and Applications of Electromechanical Phenomena in Crystals (New York: McGraw-Hill) ch XVI
30. Kobayashi J, Asahi T, Takahashi S and Glazer A M 1988 J. Appl. Cryst. 21 479
31. Szivessy G and Münster C 1934 Ann. Phys., Lpz. 20 703
32. Kobayashi J, Takada M, Hosogaya N and Someya T 1988 Ferroelectrics Lett. 8 145
33. Horinaka H, Tomii K, Sonomura H and Miyauchi T 1985 Japan. J. Appl. Phys. 24 755
34. Jones R C 1948 J. Opt. Soc. Am. 38 671
35. Hernández-Rodríguez C and Gómez-Garrido P 2000 Effect of temperature-dependent multiple reflections in crystals using a high-accuracy universal polarimeter Polarization Measurement and Analysis III, Proc. SPIE 4133-19
36. Maldonado T A and Gaylord T K 1989 Appl. Opt. 28 2075