Temperature-induced transient noise of pyroelectric thermal detector

Optical Engineering

Volumn 39, Issue 11, 2000, Pages 3076-3083

  Lee, Muno ^a   Bae, Seongho ^a  

^a Yeungnam University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

FERROELECTRIC CERAMICS; GATES (TRANSISTOR); GRAIN SIZE AND SHAPE; IRRADIATION; JUNCTION GATE FIELD EFFECT TRANSISTORS; LOW TEMPERATURE OPERATIONS; PYROELECTRICITY; SPURIOUS SIGNAL NOISE; TEMPERATURE; THERMAL EXPANSION; THERMOANALYSIS;

BURST NOISE; LOW TEMPERATURE HEAT TREATMENT; PYROELECTRIC CERAMICS; PYROELECTRIC DETECTOR; PYROELECTRIC SENSORS; PYROELECTRIC WAFERS; THERMAL DETECTOR; TRANSIENT NOISE;

SENSORS;

EID: 0034318143     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1269061     Document Type: Article

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