메뉴 건너뛰기




Volumn 23, Issue 4, 2000, Pages 737-742

Kinetics of interface reaction in 40Sn-Bi/Cu and 40Sn-Bi-2Ag/Cu systems during aging in solid state

Author keywords

[No Author keywords available]

Indexed keywords

ADDITION REACTIONS; EUTECTICS; INTERFACES (MATERIALS); INTERMETALLICS; METALLOGRAPHY; REACTION KINETICS; SILVER; SOLDERING; SOLDERING ALLOYS; TIN ALLOYS;

EID: 0034317695     PISSN: 15213323     EISSN: None     Source Type: Journal    
DOI: 10.1109/6040.883766     Document Type: Article
Times cited : (14)

References (19)
  • 1
    • 0015614563 scopus 로고
    • Interdiffusion and reaction in bi-metallic Cu-Sn thin films
    • K. N. Tu, "Interdiffusion and reaction in bi-metallic Cu-Sn thin films," Acta Metall., vol. 21, pp. 347-353, 1973.
    • (1973) Acta Metall. , vol.21 , pp. 347-353
    • Tu, K.N.1
  • 2
    • 33749921207 scopus 로고    scopus 로고
    • Aging study of Cu-Sn intermetallic in annealing surface mount solder joints
    • Orlando, FL, May
    • C. Alex, K. So, and Y. C. Chan, "Aging study of Cu-Sn intermetallic in annealing surface mount solder joints," in Proc. 46th Electron. Comp. Conf., Orlando, FL, May 1996, pp. 1166-1171.
    • (1996) Proc. 46th Electron. Comp. Conf. , pp. 1166-1171
    • Alex, C.1    So, K.2    Chan, Y.C.3
  • 4
    • 0030106421 scopus 로고
    • Effect of solid state intermetallic growth on the fracture toughness of Cu/63Sn-37Pb solder joints
    • Mar.
    • R. E. Pratt, E. I. Stromswod, and D. J. Quesnel, "Effect of solid state intermetallic growth on the fracture toughness of Cu/63Sn-37Pb solder joints," IEEE Trans. Comp., Packag., Manufact. Technol. A, vol. 19, pp. 134-141, Mar. 1995.
    • (1995) IEEE Trans. Comp., Packag., Manufact. Technol. A , vol.19 , pp. 134-141
    • Pratt, R.E.1    Stromswod, E.I.2    Quesnel, D.J.3
  • 5
    • 0031077284 scopus 로고    scopus 로고
    • Effect of intermetallic compound on the thermal fatigue of surface mount solder joint
    • Feb.
    • P. L. Tu, Y. C. Chan, and J. K. L. Lai, "Effect of intermetallic compound on the thermal fatigue of surface mount solder joint, "IEEE Trans. Comp., Packag., Manufact. Technol. B, vol. 20, pp. 87-93, Feb. 1997.
    • (1997) IEEE Trans. Comp., Packag., Manufact. Technol. B , vol.20 , pp. 87-93
    • Tu, P.L.1    Chan, Y.C.2    Lai, J.K.L.3
  • 6
    • 0030085129 scopus 로고    scopus 로고
    • The mechanical behavior of solders
    • Feb.
    • W. J. Plumbridge, "The mechanical behavior of solders," Solder Surface Mount Technol., no. 22, pp. 27-31, Feb. 1996.
    • (1996) Solder Surface Mount Technol. , Issue.22 , pp. 27-31
    • Plumbridge, W.J.1
  • 7
    • 0031269376 scopus 로고    scopus 로고
    • Effect of intermetallic compound on shear fatugue of Cu/63SnPb solder joint
    • Feb.
    • Y C. Chan, P. L. Tu, and J. K. L Lai, "Effect of intermetallic compound on shear fatugue of Cu/63SnPb solder joint," IEEE Trans. Comp., Packag., Manufact. Technol. B, vol. 20, p. 94, Feb. 1997.
    • (1997) IEEE Trans. Comp., Packag., Manufact. Technol. B , vol.20 , pp. 94
    • Chan, Y.C.1    Tu, P.L.2    Lai, J.K.L.3
  • 8
    • 33749944243 scopus 로고
    • The growth of intermetallic compounds on common base materials coated with Sn and Sn-Pb alloys
    • D. A. Unsworth and C. A. Mackay, "The growth of intermetallic compounds on common base materials coated with Sn and Sn-Pb alloys," Trans. Instrum. Meas., vol. 54, pp. IM-28-74, 1979.
    • (1979) Trans. Instrum. Meas. , vol.54
    • Unsworth, D.A.1    Mackay, C.A.2
  • 9
    • 4444355269 scopus 로고
    • Sandia National Laboratories, Mar. 2
    • J. Stephens, "Internal memorandum," Sandia National Laboratories, Mar. 2, 1989.
    • (1989) Internal Memorandum
    • Stephens, J.1
  • 10
    • 33749925985 scopus 로고
    • Intermetallic compound growth in Sn and Sn-Pb plating over nickel and its effect on solderability
    • J. Haimovich, "Intermetallic compound growth in Sn and Sn-Pb plating over nickel and its effect on solderability," Weld Res., no. 3, pp. 1029-1115, 1989.
    • (1989) Weld Res. , Issue.3 , pp. 1029-1115
    • Haimovich, J.1
  • 11
    • 0039972502 scopus 로고
    • Intermetallic growth in Sn-rich solder
    • L. Zakraysek, "Intermetallic growth in Sn-rich solder," Weld Res., pp. 536s-541s, 1972.
    • (1972) Weld Res.
    • Zakraysek, L.1
  • 13
    • 84875815403 scopus 로고
    • Developing lead-free solders: A challenge and opportunity
    • July
    • S. Jin, "Developing lead-free solders: A challenge and opportunity," JOM, p. 13, July 1993.
    • (1993) JOM , pp. 13
    • Jin, S.1
  • 14
    • 0342702510 scopus 로고
    • Properties of some low melting fusible alloys
    • IBM Fed. Syst. Div. Lab., Owego, NY
    • R. W. Wild, "Properties of some low melting fusible alloys," IBM Fed. Syst. Div. Lab., Owego, NY, Tech. Rep. 17 120048, 1971.
    • (1971) Tech. Rep. 17 120048
    • Wild, R.W.1
  • 15
    • 51249178658 scopus 로고
    • Abnormalously fast diffusion in the Fe-Zn system
    • Sept.
    • P. Shewmom et al., "Abnormalously fast diffusion in the Fe-Zn system," Metall. Trans., vol. 17A, pp. 1523-1527, Sept. 1986.
    • (1986) Metall. Trans. , vol.17 A , pp. 1523-1527
    • Shewmom, P.1
  • 16
    • 0027573019 scopus 로고
    • Characterization of diffusion induced grain boundary migration in the Ag-Cu system
    • Z. M. Guan et al., "Characterization of diffusion induced grain boundary migration in the Ag-Cu system," Acta Metall. Mater, vol. 41, no. 4, pp. 1293-1300, 1993.
    • (1993) Acta Metall. Mater , vol.41 , Issue.4 , pp. 1293-1300
    • Guan, Z.M.1
  • 18
    • 3943075789 scopus 로고    scopus 로고
    • Diffusion induced grain boundary migration
    • G. X. Liu and Z. M. Guan, "Diffusion induced grain boundary migration," Defect Diffus. Forum, vol. 150-151, pp. 150-151, 1997.
    • (1997) Defect Diffus. Forum , vol.150-151 , pp. 150-151
    • Liu, G.X.1    Guan, Z.M.2
  • 19
    • 33749949931 scopus 로고
    • Properties of some low melting fusible alloys
    • R. W. Wild, "Properties of some low melting fusible alloys," in Proc. INTERNEPCOMN'71, 1971.
    • (1971) Proc. INTERNEPCOMN'71
    • Wild, R.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.