Field emission properties of nanocomposite carbon nitride films

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 18, Issue 6, 2000, Pages 2698-2703

  Alexandrou, I ^a   Baxendale, M ^a   Rupesinghe, N L ^a   Amaratunga, G A J ^a   Kiely, C J ^b  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b UNIVERSITY OF LIVERPOOL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON INORGANIC COMPOUNDS; ELECTRIC FIELD EFFECTS; ETCHING; FIELD EMISSION CATHODES; FILM GROWTH; FULLERENES; HIGH RESOLUTION ELECTRON MICROSCOPY; SEMICONDUCTING SILICON; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

CARBON NITRIDE FILMS; FIELD EMISSION;

NANOSTRUCTURED MATERIALS;

EID: 0034317392     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1322043     Document Type: Article

References (22)

1. F. J. Himpsel, J. S. Knapp, J. A. V. Vechten, and D. E. Eastman, Phys. Rev. B 20, 624 (1979).
2. B. B. Pate, Surf. Sci. 165, 83 (1986).
3. G. A. J. Amaratunga and S. R. P. Silva, Appl. Phys. Lett. 68, 2529 (1996).
4. J. O. Choi, J. W. Huh, Y. H. Choi, M. J. K. H. Kim, Y. R. Cho, and H. S. Jeong, J. Vac. Sci. Technol. B 16, 1199 (1998).
5. S. R. P. Silva and R. G. Forbes, Ultramicroscopy 73, 51 (1998).
6. K. Okano, A. Hiraki, T. Yamada, and S. K. J. Itoh, Ultramicroscopy 73, 43 (1998).
7. E. J. Chi, J. Y. Shim, D. J. Choi, and H. K. Baik, J. Vac. Sci. Technol. B 16, 1219 (1998).
8. J. P. Zhao, Z. Y. Chen, X. Wang, S. Q. Y. T. S. Shi, X. H. Liu, J. Jang, and K. C. Park, Mater. Lett. 35, 157 (1998).
9. Y. Saito et al., Ultramicroscopy 73, 1 (1998).
10. J. M. Bonard, F. Maier, T. Stockli, A. Chatelain, W. A. deHeer, J. P. Salvetat, and L. Forro, Ultramicroscopy 73, 7 (1998).
11. S. Lee, B. Chung, T.-Y. Ko, D. Jeon, K.-R. Lee, and K. Y. Eun, Ultramicroscopy 73, 17 (1998).
12. W. A. de Heer, W. S. Bacsa, A. Châtelain, T. Gerfin, R. Humphrey-Baker, L. Forro, and D. Ugarte, Science 268, 845 (1995).
13. M. Tsukada, K. Akagi, R. Tamura, and S. Ihara, Surf. Rev. Lett. 3, 835 (1996).
14. L. Lou, P. Nordlander, and R. E. Smalley, Phys. Rev. B 52, 1429 (1995).
15. X. K. Wang, X. W. Lin, V. P. Dravid, J. P. Ketterson, and R. P. H. Chang, Appl. Phys. Lett. 66, 2430 (1995).
16. P. Bernier, W. Masier, C. Journet, A. Loiseau, M. Lamy, D. Chapelle, S. Lefrant, R. Lee, and J. E. Fischer, Carbon 36, 675 (1998).
17. I. Alexandrou, H.-J. Scheibe, C. J. Kiely, A. J. Papworth, G. A. J. Amaratunga, and B. Schultrich, Phys. Rev. B 60, 10903 (1999).
18. G. A. J. Amaratunga, M. Chhowalla, C. J. Kiely, I. Alexandrou, R. Aharonov, and R. W. Devenish, Nature (London) 383, 321 (1996).
19. I. Alexandrou, C. J. Kiely, I. Zergioti, M. Chhowalla, H.-J. Scheibe, and G. A. J. Amaratunga, Inst. Phys. Conf. Ser. 153, 581 (1997).
20. V. S. Veerasamy, J. Yuan, G. A. J. Amaratunga, W. I. Milne, K. W. R. Gilkes, M. Weiler, and L. M. Brown, Phys. Rev. B 48, 17954 (1993).
21. S. R. P. Silva, G. A. J. Amaratunga, and K. Okano, J. Vac. Sci. Technol. B 17, 557 (1999).
22. G. A. J. Amaratunga et al., New Diamond Frontier Carbon Technol. 9, 31 (1999).