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Volumn 28, Issue 5-6, 2000, Pages 407-412
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Influence of off-set energy on the electrical characteristics of Si resonant tunneling MOST (SRTMOST)
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Author keywords
[No Author keywords available]
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Indexed keywords
DIELECTRIC FILMS;
DIELECTRIC PROPERTIES;
RESONANT TUNNELING;
SEMICONDUCTING SILICON;
SUBSTRATES;
VOLTAGE MEASUREMENT;
GATE OFF CURRENTS;
OFF SET ENERGY;
TRANSITION TIME;
TRANSMISSION COEFFICIENT;
MOSFET DEVICES;
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EID: 0034316940
PISSN: 07496036
EISSN: None
Source Type: Journal
DOI: 10.1006/spmi.2000.0941 Document Type: Article |
Times cited : (4)
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References (7)
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