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Volumn 28, Issue 5-6, 2000, Pages 407-412

Influence of off-set energy on the electrical characteristics of Si resonant tunneling MOST (SRTMOST)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC FILMS; DIELECTRIC PROPERTIES; RESONANT TUNNELING; SEMICONDUCTING SILICON; SUBSTRATES; VOLTAGE MEASUREMENT;

EID: 0034316940     PISSN: 07496036     EISSN: None     Source Type: Journal    
DOI: 10.1006/spmi.2000.0941     Document Type: Article
Times cited : (4)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.