Temperature modification of the Nb oxidation at the Nb/Al interface studied by reflEXAFS

Surface Science

Volumn 468, Issue 1-3, 2000, Pages 77-84

  D'Acapito, F ^a   Mobilio, S ^b,c   Cikmacs, P ^d   Merlo, V ^d   Davoli, I ^d  

^a INFM Operating Group Grenoble   (France)

^b ROMA TRE UNIVERSITY   (Italy)

^c INFN LABORATORI NAZIONALI DI FRASCATI   (Italy)

^d UNIVERSITY OF ROME TOR VERGATA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ALUMINUM; FILM PREPARATION; HEAT TREATMENT; INTERFACES (MATERIALS); NIOBIUM; SENSITIVITY ANALYSIS;

EXTENDED X RAY ABSORPTION FINE STRUCTURES (EXAFS);

SUPERCONDUCTING FILMS;

EID: 0034316766     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00787-1     Document Type: Article

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