Structural and electrical consequences of high dopant levels in the BIMGVOX system

Solid State Ionics

Volumn 136-137, Issue , 2000, Pages 119-125

  Krok, F ^a   Abrahams, I ^b   Malys, M ^a   Bogusz, W ^a   Dygas, J R ^a   Nelstrop, J A G ^b   Bush, A J ^b  

^a WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

^b QUEEN MARY UNIVERSITY OF LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; DOPING (ADDITIVES); IONIC CONDUCTION IN SOLIDS; OPTICAL CORRELATION; SPECTROSCOPIC ANALYSIS; X RAY DIFFRACTION ANALYSIS;

OXIDE ION CONDUCTORS; POLYMORPHS;

BISMUTH COMPOUNDS;

EID: 0034316723     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-2738(00)00360-X     Document Type: Article

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