Real time pattern changing in atomic beam holography using phase shift by Stark effect

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 18, Issue 6, 2000, Pages 3590-3593

  Fujita, J ^a   Mitake, S ^b   Shimizu, F ^b  

^a NEC CORPORATION   (Japan)

^b UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; ELECTRIC FIELD EFFECTS; ELECTRIC POTENTIAL; IMAGE RECONSTRUCTION; LASER BEAMS; PHASE SHIFT;

ATOMIC BEAM HOLOGRAPHY; STARK EFFECTS;

HOLOGRAPHY;

EID: 0034316436     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1319685     Document Type: Article

References (8)

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7. J. Fujita, T. Kishimoto, S. Mitake, and F. Shimizu, Phys. Rev. Lett. 84, 4027 (2000).
8. H.-R. Noh et al. (unpublished).