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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 11, 2000, Pages 6410-6412

Structural analysis of 6H-SiC(0001)√3×√3 reconstructed surface

(7) Fujino, Toshiaki a Fuse, Takashi a Ryu, Jeong Tak a,b Inudzuka, Katsuhiko a Yamazaki, Yujin a Katayama, Mitsuhiro a Oura, Kenjiro a

a OSAKA UNIVERSITY (Japan)

b Daegu University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; COMPOSITION; LOW ENERGY ELECTRON DIFFRACTION; MONOLAYERS; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPIC ANALYSIS; SUBSTRATES; SURFACE STRUCTURE;

COAXIAL IMPACT-COLLISION ION SCATTERING SPECTROSCOPY (CAICISS);

SILICON CARBIDE;

EID: 0034315105 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.39.6410 Document Type: Article

Times cited : (13)

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