X-ray anomalous scattering study of a charge-ordered state in NaV2O5

Physical Review Letters

Volumn 85, Issue 20, 2000, Pages 4349-4352

  Nakao, H ^a,d   Ohwada, K ^a   Takesue, N ^a   Fujii, Y ^a   Isobe, M ^a   Ueda, Y ^a   Zimmermann, M V ^b   Hill, J P ^b   Gibbs, D ^b   Woicik, J C ^c   Koyama, I ^d   Murakami, Y ^d  

^a UNIVERSITY OF TOKYO   (Japan)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^d INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL SYMMETRY; ELECTRON SCATTERING; ION SOURCES; MATHEMATICAL MODELS; SUPERLATTICES; TEMPERATURE; X RAY DIFFRACTION ANALYSIS;

CHARGE ORDERING; SODIUM VANADATE; SPIN-PEIERLS STATE; X RAY ANOMALOUS SCATTERING;

VANADIUM COMPOUNDS;

EID: 0034314406     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.85.4349     Document Type: Article

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