Compton profiles of aluminum corrected by the electron correlation effect

Journal of Physics Condensed Matter

Volumn 12, Issue 47, 2000, Pages 9725-9734

  Wakoh, S ^a   Matsumoto, M ^a   Tokii, M ^b  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b GAKUSHUIN UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CORRELATION METHODS; DOPPLER EFFECT; ELECTROMAGNETIC WAVE BACKSCATTERING; FERMI LEVEL; MATHEMATICAL MODELS; X RAY SCATTERING;

COMPTON PROFILE; ELECTRON MOMENTUM DENSITY; INDEPENDENT PARTICLE MODEL (IPM);

ALUMINUM;

EID: 0034314395     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/12/47/301     Document Type: Article

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