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Volumn 35, Issue 6, 2000, Pages 1279-1292

Multiresolution time domain analysis of scattering from a rough dielectric surface

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DIELECTRIC MATERIALS; ELECTROMAGNETIC FIELDS; ERROR ANALYSIS; FINITE DIFFERENCE METHOD; TIME DOMAIN ANALYSIS; DIELECTRIC DEVICES; FINITE DIFFERENCE TIME DOMAIN METHOD; SURFACE SCATTERING;

EID: 0034313921     PISSN: 00486604     EISSN: None     Source Type: Journal    
DOI: 10.1029/1999RS002294     Document Type: Article
Times cited : (15)

References (26)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.