Thermal proximity imaging of hard-disk substrates

IEEE Transactions on Magnetics

Volumn 36, Issue 6, 2000, Pages 3997-4004

  Abraham, David W ^b   Chainer, T J ^a,b   Etzold, K F ^a,b   Wickramasinghe, H K ^a,b  

^a IEEE

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Defect detection; Defect inspection; Disk drive; HDI; Thermal imaging

Indexed keywords

FINITE ELEMENT METHOD; HARD DISK STORAGE; INSPECTION; MAGNETORESISTANCE; MATHEMATICAL MODELS; SUBSTRATES;

DEFECT DETECTION; DEFECT INSPECTION; HARD DISK SUBSTRATES; THERMAL PROXIMITY SENSING;

INFRARED IMAGING;

EID: 0034312669     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.914353     Document Type: Article

References (9)

1. Optical absorption microscopy and spectroscopy with nanometer resolution
2. Scanning thermal profiler
3. A new laser texturing technique for high-performance magnetic disk drives