Reliability, factor structure and validity of the Dutch Eysenck personality profiler

Personality and Individual Differences

Volumn 29, Issue 5, 2000, Pages 857-868

  Muris, Peter ^a   Schmidt, Henk ^a   Merckelbach, Harald ^a   Rassin, Eric ^a  

^a MAASTRICHT UNIVERSITY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0034311874     PISSN: 01918869     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0191-8869(99)00237-8     Document Type: Article

References (16)

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