Asymmetry of Stark profiles: The microfield point of view

European Physical Journal D

Volumn 12, Issue 2, 2000, Pages 355-367

  Stehle C ^a   Gilles, D ^b   Demura, A V ^c  

^a OBSERVATOIRE DE PARIS   (France)

^b CEA DIF   (France)

^c KURCHATOV INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC LINES; INTELLIGENT SYSTEMS; MONTE CARLO METHODS;

ATOMIC IONS; CLUSTER EXPANSION; ELECTRIC MICROFIELDS; ELECTRON DISTRIBUTIONS; INTERACTION POTENTIALS; LINES SHAPES; MICROFIELDS; POLARIZATION EFFECT; QUADRUPOLES; STARK PROFILES;

IONS;

EID: 0034310997     PISSN: 14346060     EISSN: None     Source Type: Journal    
DOI: 10.1007/s100530070032     Document Type: Article

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