Calculation of the critical parameters of self-exciting processes in the electrothermal destruction of dielectric diodes

Measurement Techniques

Volumn 43, Issue 11, 2000, Pages 973-981

  Bogomol'nyi, V M ^a  

^a NONE

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EID: 0034310994     PISSN: 05431972     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1010988812433     Document Type: Article

References (36)

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