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Volumn 34, Issue 11, 2000, Pages 1264-1269

Basic principles of postgrowth annealing of CdTe:Cl ingot to obtain semi-insulating crystals

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EID: 0034310957     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1325420     Document Type: Article
Times cited : (31)

References (31)
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    • (1975) Dokl Akad. Nauk SSSR , vol.225 , pp. 77
    • Arkad'eva, E.N.1    Maslova, L.V.2    Matveev, O.A.3
  • 3
    • 77950441641 scopus 로고
    • E. N Arkad'eva, L. V. Maslova, O. A. Matveev, et al., Dokl Akad. Nauk SSSR 225, 77 (1975) [Sov. Phys. Dokl 20, 211 (1975)]; O. A. Matveev and A. I. Terent'ev, in Proceedings of the 11th Workshop on Room Temperature Semiconductor X- and Gamma-ray Detectors and Associated Electronics, Vienna, 1999, p. 56.
    • (1975) Sov. Phys. Dokl , vol.20 , pp. 211
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    • 84882467797 scopus 로고
    • O. A. Matveev, E. N. Arkad'eva, and L. A. Goncharov, Dokl. Akad. Nauk SSSR 221, 325 (1975) [Sov. Phys. Dokl. 20, 220 (1975)].
    • (1975) Sov. Phys. Dokl. , vol.20 , pp. 220
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    • 21344486268 scopus 로고
    • O. A. Matveev and A. I. Terent'ev, Fiz. Tekh. Poluprovodn. (St. Petersburg) 27, 1894 (1993) [Semiconductors 27, 1043 (1993)].
    • (1993) Semiconductors , vol.27 , pp. 1043
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    • 0009877315 scopus 로고    scopus 로고
    • O. A. Matveev and A. I. Terent'ev, Fiz. Tekh. Poluprovodn. (St. Petersburg) 32, 159 (1998) [Semiconductors 32, 144 (1998)].
    • (1998) Semiconductors , vol.32 , pp. 144
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    • O. A. Matveev and A. I. Terent'ev, Fiz. Tekh. Poluprovodn. (St. Petersburg) 29, 378 (1995) Semiconductors 29, 191 (1995)].
    • (1995) Semiconductors , vol.29 , pp. 191
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    • E. N. Arkad'eva, O. A. Matveev, E. N. Mel'nikova, and A. I. Terent'ev, Fiz. Tekh. Poluprovodn. (Leningrad) 14, 1415 (1980) [Sov. Phys. Semicond. 14, 839 (1980)].
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    • Mir, Moscow
    • A. C. Damask and G. J. Dienes, Point Defects in Metals (Gordon and Breach, New York, 1963; Mir, Moscow, 1966).
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    • 0014825762 scopus 로고
    • M. V. Alekseenko, E. N. Arkad'eva, and O. A. Matveev, Fiz. Tekh. Poluprovodn. (Leningrad) 4, 414 (1970) [Sov. Phys. Semicond. 4, 349 (1970)].
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