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Volumn 72, Issue 19, 2000, Pages 4762-4765
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Calibration of analytical instruments. Impact of nonconstant variance in calibration data
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Author keywords
[No Author keywords available]
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Indexed keywords
TRACE METAL;
ACCURACY;
ARTICLE;
CALIBRATION;
INSTRUMENT;
MASS SPECTROMETRY;
REGRESSION ANALYSIS;
SEMICONDUCTOR;
VARIANCE;
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EID: 0034306962
PISSN: 00032700
EISSN: None
Source Type: Journal
DOI: 10.1021/ac000018s Document Type: Article |
Times cited : (14)
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References (1)
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