Simulation of excitonic spectra in electric field to characterize the quality of low dimensional structures

Applied Surface Science

Volumn 166, Issue 1, 2000, Pages 273-277

  Lazarenkova, O L ^a   Pikhtin, A N ^a  

^a SAINT PETERSBURG ELECTROTECHNICAL UNIVERSITY LETI   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FIELD EFFECTS; INTERFACES (MATERIALS); LIGHT ABSORPTION; LIGHT MODULATION; SPECTROSCOPIC ANALYSIS; SURFACE ROUGHNESS;

MODULATION OPTICAL SPECTROSCOPY;

SEMICONDUCTOR QUANTUM WELLS;

EID: 0034301070     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00405-0     Document Type: Article

References (3)

1. Lazarenkova O.L., Pikhtin A.N. Phys. Status Solidi A. 175:1999;51.
2. Lazarenkova O.L., Pikhtin A.N. Semiconductors. 32:1998;992.
3. Miller D.A.B., Chemla D.S., Damen T.C., Gossard A.C., Wiegmann W., Wood T.H., Burrus C.A. Phys. Rev. B. 32:1985;1043.