SCOPUS 정보 검색 플랫폼

International Journal of Infrared and Millimeter Waves

Volumn 21, Issue 10, 2000, Pages 1579-1587

Application of free carrier absorption for far-infrared detection

(2) Shen, W Z a,c Perera, A G U b

a SHANGHAI JIAO TONG UNIVERSITY (China)

b GEORGIA STATE UNIVERSITY (United States)

c SHANGHAI INSTITUTE OF TECHNICAL PHYSICS (China)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CRYSTALLINE MATERIALS; EPITAXIAL GROWTH; INFRARED DETECTORS; REGRESSION ANALYSIS; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTING SILICON; THIN FILMS;

ABSORPTION COEFFICIENT; FAR INFRARED DETECTION; FREE CARRIER CONCENTRATION; FREE HOLE ABSORPTION;

LIGHT ABSORPTION;

EID: 0034300491 PISSN: 01959271 EISSN: None Source Type: Journal
DOI: 10.1023/A:1006655424471 Document Type: Article

Times cited : (3)

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