Deterministic model for branched structures in the electrical breakdown of solid polymeric dielectrics

Journal of Physics D: Applied Physics

Volumn 33, Issue 19, 2000, Pages

  Dissado, L A ^a   Fothergill, J C ^a   Wise, N ^a   Willby, A ^a   Cooper, J ^b  

^a UNIVERSITY OF LEICESTER   (United Kingdom)

^b NATIONAL GRID   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHAOS THEORY; ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC FIELD EFFECTS; POLYMERS;

BRANCHED STRUCTURES; SOLID POLYMERIC DIELECTRICS;

DIELECTRIC MATERIALS;

EID: 0034299531     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/33/19/103     Document Type: Article

References (20)

1. Niemeyer L, Pietronero L and Wiesmann H J 1982 Phys. Rev. Lett. 52 1033
2. Noskpov M D, Kukhta V R and Lopatin V V 1995 J. Phys. D: Appl. Phys. 28 1187; Satpathy S 1986 Phys. Rev. B 33 5093; Elezgaray J F, Muzy J F, Argoul F and Arneodo A 1993 Phys. Rev. Lett. 71 2425; Lopatin V, Noskov M D, Badent R, Kisto K and Swab A J 1998 IEEE Trans. Diel. EI 5 250; Noskov M D, Malinovski A S, Sack M and Schwab A J 1999 Ann. Rep. CEIDP (IEEE Conf. Pub. 99CH36319) 597-600
3. Noskpov M D, Kukhta V R and Lopatin V V 1995 J. Phys. D: Appl. Phys. 28 1187; Satpathy S 1986 Phys. Rev. B 33 5093; Elezgaray J F, Muzy J F, Argoul F and Arneodo A 1993 Phys. Rev. Lett. 71 2425; Lopatin V, Noskov M D, Badent R, Kisto K and Swab A J 1998 IEEE Trans. Diel. EI 5 250; Noskov M D, Malinovski A S, Sack M and Schwab A J 1999 Ann. Rep. CEIDP (IEEE Conf. Pub. 99CH36319) 597-600
4. Noskpov M D, Kukhta V R and Lopatin V V 1995 J. Phys. D: Appl. Phys. 28 1187; Satpathy S 1986 Phys. Rev. B 33 5093; Elezgaray J F, Muzy J F, Argoul F and Arneodo A 1993 Phys. Rev. Lett. 71 2425; Lopatin V, Noskov M D, Badent R, Kisto K and Swab A J 1998 IEEE Trans. Diel. EI 5 250; Noskov M D, Malinovski A S, Sack M and Schwab A J 1999 Ann. Rep. CEIDP (IEEE Conf. Pub. 99CH36319) 597-600
5. Noskpov M D, Kukhta V R and Lopatin V V 1995 J. Phys. D: Appl. Phys. 28 1187; Satpathy S 1986 Phys. Rev. B 33 5093; Elezgaray J F, Muzy J F, Argoul F and Arneodo A 1993 Phys. Rev. Lett. 71 2425; Lopatin V, Noskov M D, Badent R, Kisto K and Swab A J 1998 IEEE Trans. Diel. EI 5 250; Noskov M D, Malinovski A S, Sack M and Schwab A J 1999 Ann. Rep. CEIDP (IEEE Conf. Pub. 99CH36319) 597-600
6. Noskpov M D, Kukhta V R and Lopatin V V 1995 J. Phys. D: Appl. Phys. 28 1187; Satpathy S 1986 Phys. Rev. B 33 5093; Elezgaray J F, Muzy J F, Argoul F and Arneodo A 1993 Phys. Rev. Lett. 71 2425; Lopatin V, Noskov M D, Badent R, Kisto K and Swab A J 1998 IEEE Trans. Diel. EI 5 250; Noskov M D, Malinovski A S, Sack M and Schwab A J 1999 Ann. Rep. CEIDP (IEEE Conf. Pub. 99CH36319) 597-600
7. Wiesmann H J and Zeller H R 1986 J. Appl. Phys. 60 1770
8. Barclay A L, Sweeney P J, Dissado L A and Stevens G C 1990 J. Phys. D: Appl. Phys. 23 1536
9. Pietronero L and Wiesman H J 1988 Z. Phys B 70 87
10. Dissado L A and Sweeney P J J 1993 Phys. Rev. B 48 16261
11. Dissado L A, Dodd S J, Champion J V, Williams P I and Alison J M 1997 IEEE Trans. Diel. EI 4 259
12. Dissado L A and Fothergill J C 1992 Electrical Degradation and Breakdown in Polymers chap 5 IEE Materials and Devices Series 9 ed G C Stevens (London: Peregrinus)
13. Dodd S J, Dissado L A, Champion J V and Alison J M 1995 Phys. Rev. B 52 16985
14. Tanaka Y, Ohnuma N, Katsunami K and Ohki Y 1991 IEEE Trans. EI 26 258
15. Fothergill J C, Dissado L A and Sweeney P J J 1994 IEEE Trans. Diel. EI 1 474
16. Zeller H R and Schneider W R J. Appl. Phys. 1984 56 455; Hadid A and Laurent C IEEE Trans. EI 1991 27 1095; Hibma T and Zeller H R 1986 J. Appl. Phys. 59 1614
17. Zeller H R and Schneider W R J. Appl. Phys. 1984 56 455; Hadid A and Laurent C IEEE Trans. EI 1991 27 1095; Hibma T and Zeller H R 1986 J. Appl. Phys. 59 1614
18. Zeller H R and Schneider W R J. Appl. Phys. 1984 56 455; Hadid A and Laurent C IEEE Trans. EI 1991 27 1095; Hibma T and Zeller H R 1986 J. Appl. Phys. 59 1614
19. Champion J V and Dodd S J 1996 J. Phys. D: Appl. Phys. 29 862
20. Kearney M J and Stark J 1992 GEC J. Res. 10(1) 52-8