X-ray modeling for industrial applications

NDT and E International

Volumn 33, Issue 7, 2000, Pages 481-488

  Tillack, G R ^a   Nockemann, C ^a   Bellon, C ^a  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER SIMULATION; MARKOV PROCESSES; MATHEMATICAL MODELS; RAY TRACING; X RAY RADIOGRAPHY; X RAY SCATTERING;

RADIOGRAPHIC INSPECTION SYSTEM; X RAY IMAGING; X RAY MODELING;

NONDESTRUCTIVE EXAMINATION;

EID: 0034299449     PISSN: 09638695     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0963-8695(00)00019-0     Document Type: Article

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