Aging in a relaxor ferroelectric: scaling and memory effects

Physical Review Letters

Volumn 85, Issue 14, 2000, Pages 3033-3036

  Colla, Eugene V ^a   Chao, Lambert K ^a   Weissman, M B ^a   Viehland, Dwight D ^b  

^a University of Illinois at Urbana Champaign   (United States)

^b Naval Seacommand Division   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; CRYSTAL GROWTH FROM MELT; CRYSTAL STRUCTURE; DIELECTRIC RELAXATION; GLASS TRANSITION; LEAD COMPOUNDS; MAGNETIC SUSCEPTIBILITY; MATHEMATICAL MODELS; NUMERICAL ANALYSIS; SINGLE CRYSTALS; TEMPERATURE; THERMAL EFFECTS;

DIELECTRIC SUSCEPTIBILITY; NONLINEAR SUSCEPTIBILITY; RELAXOR FERROELECTRICS; THERMAL DEPOLARIZATION;

FERROELECTRIC MATERIALS;

EID: 0034299034     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.85.3033     Document Type: Article

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