Algorithms to select IDDQ measurement vectors for bridging faults in sequential circuits

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 16, Issue 5, 2000, Pages 443-451

  Higami, Yoshinobu ^a   Takamatsu, Yuzo ^a   Saluja, Kewal K ^a   Kinoshita, Kozo ^a  

^a EHIME UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CURRENT MEASUREMENT; ELECTRIC NETWORK ANALYSIS; HEURISTIC METHODS; VECTORS;

BRIDGING FAULTS;

SEQUENTIAL CIRCUITS;

EID: 0034298662     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1008360430959     Document Type: Article

References (12)

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