Degradation of insulating materials under electrical stress

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 7, Issue 5, 2000, Pages 590-601

  Mayoux, C ^a  

^a UNIVERSITÉ DE TOULOUSE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL STRESS;

DEGRADATION; ELECTRIC FIELD EFFECTS; IONIZATION; MOLECULAR STRUCTURE; PHYSICAL CHEMISTRY;

ELECTRIC INSULATING MATERIALS;

EID: 0034298196     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2000.879355     Document Type: Article

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