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Volumn 91, Issue 10, 2000, Pages 863-867
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Suitability and reliability of platinum as under-bump metallization in flip chip solder interconnections;Eignung und Zuverlaessigkeit von Platin als Unterbumpmetallisierung in Flip-Chip-Loetverbindungen
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Author keywords
[No Author keywords available]
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Indexed keywords
ADHESION;
ENERGY DISPERSIVE SPECTROSCOPY;
FOCUSING;
INTERCONNECTION NETWORKS;
METALLIZING;
PLATINUM;
SCANNING ELECTRON MICROSCOPY;
SUBSTRATES;
UNDER-BUMP METALLIZATION (UBM);
FLIP CHIP DEVICES;
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EID: 0034297869
PISSN: 00443093
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (1)
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References (8)
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