Microstructure and electrical properties of Mn-Ni-In spinels

Physica Status Solidi (A) Applied Research

Volumn 181, Issue 2, 2000, Pages 369-386

  Metzmacher, C ^a,c   Groen, W A ^a   Reaney, I M ^b  

^a PHILIPS RESEARCH LABORATORIES   (Germany)

^b UNIVERSITY OF SHEFFIELD   (United Kingdom)

^c NONE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; AGING OF MATERIALS; COMPOSITION; CRYSTAL MICROSTRUCTURE; ELECTRIC CONDUCTIVITY MEASUREMENT; NEGATIVE TEMPERATURE COEFFICIENT; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; TWINNING; X RAY DIFFRACTION ANALYSIS;

MANGANESE NICKEL INDIUM SPINELS; PHASE BOUNDARY; THERMAL CONSTANTS;

SEMICONDUCTING MANGANESE COMPOUNDS;

EID: 0034296859     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200010)181:2<369::AID-PSSA369>3.0.CO;2-5     Document Type: Article

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