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Volumn 147, Issue 10, 2000, Pages 3889-3891

Increased copper outplating from dilute HF solutions on microstructurally modified silicon surfaces

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; CRYSTAL STRUCTURE; IONS; MICROSTRUCTURE; NUCLEATION; PARTICLE SIZE ANALYSIS; SCANNING ELECTRON MICROSCOPY; SOLUTIONS; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0034296387     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1393991     Document Type: Article
Times cited : (3)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.