Discussion on spatial resolution and sensitivity of Fourier transform fringe detection

Optical Engineering

Volumn 39, Issue 10, 2000, Pages 2715-2719

  Zhao, Bing ^a   Asundi, Anand ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER TRANSFORMS; IMAGE QUALITY;

CARRIER FRINGE PITCH;

IMAGE PROCESSING;

EID: 0034296227     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1290683     Document Type: Article

References (13)

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10. Y. Surrel, Private Communication, National Metrology Institute, CNAM, Paris, France.
11. A. D. Helfrick and W. D. Cooper, "Measurement and error," Chap. 1 in Modern Electronic Instrumentation and Measurement Techniques, Prentice-Hall, Englewood Cliffs, NJ (1990).
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