Quality assessment of different PSA-instruments with mixtures of two particle size distributions

Particle and Particle Systems Characterization

Volumn 17, Issue 3, 2000, Pages 105-112

  Leschonski, Kurt ^a   Benker, Bernd ^b   Powitz, Harald ^b  

^a CLAUSTHAL UNIVERSITY OF TECHNOLOGY   (Germany)

^b CUTEC Institut GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CENTRIFUGES; X RAY DIFFRACTION;

DIFFRACTION PATTERN ANALYZER;

PARTICLE SIZE ANALYSIS;

EID: 0034296205     PISSN: 09340866     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-4117(200010)17:3<105::AID-PPSC105>3.0.CO;2-V     Document Type: Article

References (7)

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3. T. Allen, R. D. Nelson Jr.: Difrusional Broading of Sedimentation Curves. First International Particle Technology Forum, August 17-19 1994, Denver, pp. 113-119.
4. B. Benker, U. Bauer, K. Leschonski: Characterization of a Submicron Classification Process with Two Different Instruments for Particle Size Analysis. PARTEC 98, 7th Europ. Symp. Particle Characterization, Preprints II, 1998, pp. 761-770.
5. K. Leschonski, K. Legenhausen: Comparison of the Errors of Different Instruments for Particle Size Analysis and their Influence on the Characterization of Classification Processes. Prepr. 1. World Congress Particle Technology, Nürnberg, 1986, Part I, pp. 235-254.
6. K. Leschonski, H. Herrmann: Einfluß und Berücksichtigung von Fehlern der Partikelgrößenanalyse bei der Ermittlung von Trennkurven. Proc. 2. Europ. Symp. Partikelmeßtechnik, Nürnberg 1979, pp. 41-58.
7. K. Leschonski: Particle Size Analysis and Characterization of a Classification Process. Ullmann's Encyclopedia of Industrial Chemistry, 5th Edition, Vol. B2 1988, pp. 1-33.