Shear response of molecularly thin liquid films to an applied air stress

Physical Review Letters

Volumn 85, Issue 18, 2000, Pages 3902-3905

  Mate, C Mathew ^a   Marchon, Bruno ^a  

^a IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHANNEL FLOW; COMPUTER SIMULATION; ELLIPSOMETRY; FLUORINE CONTAINING POLYMERS; INTERFACES (MATERIALS); LAMINAR FLOW; MONOLAYERS; NITROGEN; PARAFFINS; SHEAR STRESS; SILICON WAFERS; YIELD STRESS;

FILM THICKNESS; PERFLUOROPOLYETHER POLYMER; SQUALANE; STATIC FRICTION; VISCOUS FRICTION;

THIN FILMS;

EID: 0034292683     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.85.3902     Document Type: Article

References (30)

1. J. N. Israelachvili, P. M. McGuiggan, and A. M. Homola, Science 240, 189 (1988).
2. H. Yoshizawa, P. McGuiggan, and J. Israelachvili, Science 259, 1305 (1993).
3. S. Granick, Science 253, 1374 (1991).
4. G. Luengo, J. Israelachvili, and S. Granick, Wear 200, 328 (1996).
5. J. Krim and A. Widom, Phys. Rev. B 38, 12 184 (1988); A. Widom and J. Krim, ibid. 34, 1403 (1986).
6. J. Krim and A. Widom, Phys. Rev. B 38, 12 184 (1988); A. Widom and J. Krim, ibid. 34, 1403 (1986).
7. C. Mak, C. Daly, and J. Krim, Thin Solid Films 253, 190 (1994).
8. C. Mak and J. Krim, Phys. Rev. B 58, 5157 (1998).
9. P. A. Thompson, G. S. Grest, and M. O. Robbins, Phys. Rev. Lett. 68, 3448 (1992).
10. M. Schoen, C. L. Rhykerd, Jr., D. J. Diestler, and J. H. Cushman, Science 245, 1223 (1989).
11. U. Landman, Solid State Commun. 107, 693 (1998).
12. G. He, M. H. Muser, and M. O. Robbins, Science 284, 1650 (1999).
13. J. Krim, Comments Condens. Matter Phys. 17, 263 (1995).
14. A. M. Homola, H. V. Nguyen, and G. Hadziioannou, J. Chem. Phys. 94, 2346 (1991).
15. M. Ruths and S. Granick, Tribol. Lett. 7, 161 (1999).
16. S. J. Hirz, A. M. Homola, G. Hadziioannou, and C. W. Frank, Langmuir 8, 328 (1992).
17. G. Reiter, A L. Demirel, and S. Granick, Science 263, 1741 (1994).
18. G. Reiter, A. L. Demirel, J. Peanasky, L. L. Cai, and S. Granick, J. Chem. Phys. 101, 2606 (1994).
19. A. L. Demirel and S. Granick, Phys. Rev. Lett. 77, 4330 (1996).
20. B. V. Deryaguin, G. M. Strakhosvky, and D. S. Malysheva, Acta Phys. 19, 541 (1944).
21. B. V. Deryaguin, V. V. Karasev, I. A. Lavygin, I. I. Skorokhodov, and E. N. Khromova, Spec. Discuss. Faraday Soc. 1, 98 (1970); reprinted in Prog. Surf. Sci. 40, 322 (1992).
22. B. V. Deryaguin, V. V. Karasev, I. A. Lavygin, I. I. Skorokhodov, and E. N. Khromova, Spec. Discuss. Faraday Soc. 1, 98 (1970); reprinted in Prog. Surf. Sci. 40, 322 (1992).
23. T. E. Faber, Fluid Dynamics for Physicists (Cambridge University, Cambridge, England, 1995), p. 208.
24. C. D. Hahm and B. Bhushan, J. Appl. Phys. 81, 5384 (1997).
25. C. M. Mate and V. J. Novotny, J. Chem. Phys. 94, 8420 (1991).
26. M. Voue, J. De Coninck, S. Villette, M. P. Valignat, and A. M. Cazabat, Thin Solid Films 313-314, 819 (1998).
27. F. Heslot, N. Fraysse, and A. M. Cazabat, Nature (London) 338, 640 (1989).
28. S. Heslot, A. M. Cazabat, P. Levinson, and N. Fraysse, Phys. Rev. Lett. 65, 599 (1990).
29. S. Balasubramanian, M. L. Klein, and J. I. Siepmann, J. Phys. Chem. 100, 11 960 (1996).
30. J. Gao, W. D. Luedtke, and U. Landman, J. Chem. Phys. 106, 4309 (1997).