Optimal grid pattern for automated camera calibration using cross ratio

IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

Volumn E83-A, Issue 10, 2000, Pages 1921-1928

  Matsunaga, Chikara ^a,c   Kanazawa, Yasushi ^a,b   Kanatani, Kenichi ^a,b  

^a FOR A Co Ltd   (Japan)

^b TOYOHASHI UNIVERSITY OF TECHNOLOGY   (Japan)

^c GUNMA UNIVERSITY   (Japan)

Author keywords

Cross ratio; Error analysis; Markov process; Reliability evaluation; Virtual studio

Indexed keywords

OPTIMAL GRID PATTERNS;

CALIBRATION; CAMERAS; EDGE DETECTION; ERROR ANALYSIS; IMAGE ANALYSIS; MARKOV PROCESSES; RELIABILITY;

PATTERN MATCHING;

EID: 0034292538     PISSN: 09168508     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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