Photoemission and low-energy electron diffraction studies of 3,4,9,10-perylene tetracarboxylic dianhydride layers on Si(111):H

Surface Science

Volumn 464, Issue 2-3, 2000, Pages 265-271

  Tengelin Nilsson, M ^a   Ilver, L ^a   Kanski, J ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; HOLE TRAPS; HYDROGEN; LOW ENERGY ELECTRON DIFFRACTION; MOLECULAR DYNAMICS; MOLECULAR STRUCTURE; PASSIVATION; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; SEMICONDUCTING SILICON;

ANGLE-RESOLVED PHOTOELECTRON SPECTROSCOPY (ARPES);

SEMICONDUCTING FILMS;

EID: 0034292294     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00708-1     Document Type: Article

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