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Volumn 22, Issue 9, 2000, Pages 735-742
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Prediction of fatigue failure location on a component using a critical distance method
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
FAILURE ANALYSIS;
STRESS CONCENTRATION;
CRITICAL DISTANCE METHOD;
FATIGUE FAILURE;
FATIGUE OF MATERIALS;
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EID: 0034292279
PISSN: 01421123
EISSN: None
Source Type: Journal
DOI: 10.1016/S0142-1123(00)00062-1 Document Type: Article |
Times cited : (146)
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References (11)
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